光源照射面積大且照射角度自由度高,適合檢測材料上表面或下表面應用。
The light source has a large irradiation area and a high degree of freedom of irradiation Angle, which is
suitable for detecting the upper or lower surface of the material.
Copyright ? 凱多智能科技(上海)有限公司 版權所有 網(wǎng)站維護 備案號:滬ICP備19033417號-1
網(wǎng)站地圖 | 法律聲明 | 隱私政策 |